Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress

L. Michalas, G. J. Papaioannou, Apostolos T. Voutsas. Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectronics Reliability, 50(9-11):1848-1851, 2010. [doi]

Authors

L. Michalas

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G. J. Papaioannou

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Apostolos T. Voutsas

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