L. Michalas, G. J. Papaioannou, Apostolos T. Voutsas. Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectronics Reliability, 50(9-11):1848-1851, 2010. [doi]
@article{MichalasPV10,
title = {Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress},
author = {L. Michalas and G. J. Papaioannou and Apostolos T. Voutsas},
year = {2010},
doi = {10.1016/j.microrel.2010.07.090},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.090},
researchr = {https://researchr.org/publication/MichalasPV10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1848-1851},
}