A Feature Selection Methodology for Steganalysis

Yoan Miche, Benoit Roue, Amaury Lendasse, Patrick Bas. A Feature Selection Methodology for Steganalysis. In Bilge Günsel, Anil K. Jain, A. Murat Tekalp, Bülent Sankur, editors, Multimedia Content Representation, Classification and Security, International Workshop, MRCS 2006, Istanbul, Turkey, September 11-13, 2006, Proceedings. Volume 4105 of Lecture Notes in Computer Science, pages 49-56, Springer, 2006. [doi]

Abstract

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