A Simulation Study of Plasmonic Substrate for In-Process Measurement of Refractive Index in Nano-Stereolithography

Masaki Michihata, Deqing Kong, Kiyoshi Takamasu, Satoru Takahashi. A Simulation Study of Plasmonic Substrate for In-Process Measurement of Refractive Index in Nano-Stereolithography. IJAT, 11(5):772-780, 2017. [doi]

Abstract

Abstract is missing.