Tom Middleton. Functional Test Vector Generation for Digital LSI/VLSI Devices. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 682-691, IEEE Computer Society, 1983.
@inproceedings{Middleton83,
title = {Functional Test Vector Generation for Digital LSI/VLSI Devices},
author = {Tom Middleton},
year = {1983},
tags = {testing},
researchr = {https://researchr.org/publication/Middleton83},
cites = {0},
citedby = {0},
pages = {682-691},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}