Adersh Miglani, Sumantra Dutta Roy, Santanu Chaudhury, J. B. Srivastava. Complete visual metrology using relative affine structure. In Gaurav Harit, Sukhendu Das, editors, Fourth National Conference on Computer Vision, Pattern Recognition, Image Processing and Graphics, NCVPRIPG 2013, Jodhpur, India, December 18-21, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.