Alejandro Millán, Jorge Juan-Chico, Manuel J. Bellido, Paulino Ruiz-de-Clavijo, David Guerrero. Characterization of Normal Propagation Delay for Delay Degradation Model (DDM). In Bertrand Hochet, Antonio J. Acosta, Manuel J. Bellido, editors, Integrated Circuit Design. Power and Timing Modeling, Optimization and Simulation, 12th International Workshop, PATMOS 2002, Seville, Spain, September 11-13, 2002. Volume 2451 of Lecture Notes in Computer Science, pages 477-486, Springer, 2002. [doi]
Abstract is missing.