Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials - researchr publication authors

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Matthew J. Miller, Matthew J. Cabral, Elizabeth C. Dickey, James M. LeBeau, Brian J. Reich. Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. Technometrics, 64(1):103-113, 2022. [doi]

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