Matthew J. Miller, Matthew J. Cabral, Elizabeth C. Dickey, James M. LeBeau, Brian J. Reich. Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. Technometrics, 64(1):103-113, 2022. [doi]
@article{MillerCDLR22,
title = {Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials},
author = {Matthew J. Miller and Matthew J. Cabral and Elizabeth C. Dickey and James M. LeBeau and Brian J. Reich},
year = {2022},
doi = {10.1080/00401706.2021.1905070},
url = {https://doi.org/10.1080/00401706.2021.1905070},
researchr = {https://researchr.org/publication/MillerCDLR22},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {64},
number = {1},
pages = {103-113},
}