Using industry-grade test equipment in a digital test and product engineering lab course

Christopher Miller, Tina A. Hudson, Shannon Sipes. Using industry-grade test equipment in a digital test and product engineering lab course. In 2015 IEEE International Conference on Microelectronics Systems Education, MSE 2015, Pittsburgh, PA, USA, May 20-21, 2015. pages 13-16, IEEE Computer Society, 2015. [doi]

Authors

Christopher Miller

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Tina A. Hudson

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Shannon Sipes

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