Christopher Miller, Tina A. Hudson, Shannon Sipes. Using industry-grade test equipment in a digital test and product engineering lab course. In 2015 IEEE International Conference on Microelectronics Systems Education, MSE 2015, Pittsburgh, PA, USA, May 20-21, 2015. pages 13-16, IEEE Computer Society, 2015. [doi]
@inproceedings{MillerHS15,
title = {Using industry-grade test equipment in a digital test and product engineering lab course},
author = {Christopher Miller and Tina A. Hudson and Shannon Sipes},
year = {2015},
doi = {10.1109/MSE.2015.7160006},
url = {http://doi.ieeecomputersociety.org/10.1109/MSE.2015.7160006},
researchr = {https://researchr.org/publication/MillerHS15},
cites = {0},
citedby = {0},
pages = {13-16},
booktitle = {2015 IEEE International Conference on Microelectronics Systems Education, MSE 2015, Pittsburgh, PA, USA, May 20-21, 2015},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-9915-6},
}