Assessment of Data Retainability of 2T DRAM for Processing-In-Memory Application

Ju Hong Min, Soomin Kim, Jang-Hyun Kim, Seongjae Cho. Assessment of Data Retainability of 2T DRAM for Processing-In-Memory Application. IET Circuits, Devices & Systems, 2025, 2025. [doi]

Abstract

Abstract is missing.