Salvador Mir, Marcelo Lubaszewski, Bernard Courtois. Unified built-in self-test for fully differential analog circuits. J. Electronic Testing, 9(1-2):135-151, 1996. [doi]
@article{MirLC96a, title = {Unified built-in self-test for fully differential analog circuits}, author = {Salvador Mir and Marcelo Lubaszewski and Bernard Courtois}, year = {1996}, doi = {10.1007/BF00137570}, url = {http://dx.doi.org/10.1007/BF00137570}, tags = {testing}, researchr = {https://researchr.org/publication/MirLC96a}, cites = {0}, citedby = {0}, journal = {J. Electronic Testing}, volume = {9}, number = {1-2}, pages = {135-151}, }