A Reliability Enhancement Mechanism for High-Assurance MLC Flash-Based Storage Systems

Irfan F. Mir, Alistair A. McEwan. A Reliability Enhancement Mechanism for High-Assurance MLC Flash-Based Storage Systems. In 17th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, RTCSA 2011, Toyama, Japan, August 28-31, 2011, Volume 1. pages 190-194, IEEE Computer Society, 2011. [doi]

Abstract

Abstract is missing.