On the test of single via related defects in digital VLSI designs - researchr publication authors

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Nunzio Mirabella, Maurizio Ricci, Michelangelo Grosso. On the test of single via related defects in digital VLSI designs. In 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2020, Novi Sad, Serbia, April 22-24, 2020. pages 1-6, IEEE, 2020. [doi]

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