Variability aware modeling of SoCs: From device variations to manufactured system yield - researchr publication authors

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Miguel Miranda, B. Dierickx, P. Zuber, P. Dobrovoln, F. Kutscherauer, P. Roussel, P. Poliakov. Variability aware modeling of SoCs: From device variations to manufactured system yield. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 547-553, IEEE, 2009. [doi]

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