Evolving More Testable Digital Combinational Circuits - researchr publication authors

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Nahid Mirzaie, Seyyed Javad Seyyed Mahdavi, Karim Mohammadi. Evolving More Testable Digital Combinational Circuits. In Hamid R. Arabnia, Ashu M. G. Solo, editors, Proceedings of the 2010 International Conference on Computer Design, CDES 2010, July 12-15, 2010, Las Vegas Nevada, USA. pages 40-45, CSREA Press, 2010.

This author has not been identified. Look up 'Nahid Mirzaie' in GoogleThis author has not been identified. Look up 'Seyyed Javad Seyyed Mahdavi' in GoogleThis author has not been identified. Look up 'Karim Mohammadi' in Google

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