Mehdi Mirzapour, Christian Retoré. Venn Diagram and Evaluation of Syllogisms with Negative Terms: A New Algorithm. In Peter Chapman, Gem Stapleton, Amirouche Moktefi, Sarah Pérez-Kriz, Francesco Bellucci, editors, Diagrammatic Representation and Inference - 10th International Conference, Diagrams 2018, Edinburgh, UK, June 18-22, 2018, Proceedings. Volume 10871 of Lecture Notes in Computer Science, pages 716-720, Springer, 2018. [doi]
@inproceedings{MirzapourR18,
title = {Venn Diagram and Evaluation of Syllogisms with Negative Terms: A New Algorithm},
author = {Mehdi Mirzapour and Christian Retoré},
year = {2018},
doi = {10.1007/978-3-319-91376-6_66},
url = {https://doi.org/10.1007/978-3-319-91376-6_66},
researchr = {https://researchr.org/publication/MirzapourR18},
cites = {0},
citedby = {0},
pages = {716-720},
booktitle = {Diagrammatic Representation and Inference - 10th International Conference, Diagrams 2018, Edinburgh, UK, June 18-22, 2018, Proceedings},
editor = {Peter Chapman and Gem Stapleton and Amirouche Moktefi and Sarah Pérez-Kriz and Francesco Bellucci},
volume = {10871},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-319-91376-6},
}