Mehdi Mirzapour, Christian Retoré. Venn Diagram and Evaluation of Syllogisms with Negative Terms: A New Algorithm. In Peter Chapman, Gem Stapleton, Amirouche Moktefi, Sarah Pérez-Kriz, Francesco Bellucci, editors, Diagrammatic Representation and Inference - 10th International Conference, Diagrams 2018, Edinburgh, UK, June 18-22, 2018, Proceedings. Volume 10871 of Lecture Notes in Computer Science, pages 716-720, Springer, 2018. [doi]
Abstract is missing.