Prabhat Mishra, Mingsong Chen. Efficient Techniques for Directed Test Generation Using Incremental Satisfiability. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 65-70, IEEE, 2009. [doi]
@inproceedings{MishraC09,
title = {Efficient Techniques for Directed Test Generation Using Incremental Satisfiability},
author = {Prabhat Mishra and Mingsong Chen},
year = {2009},
doi = {10.1109/VLSI.Design.2009.72},
url = {http://dx.doi.org/10.1109/VLSI.Design.2009.72},
tags = {testing, incremental},
researchr = {https://researchr.org/publication/MishraC09},
cites = {0},
citedby = {0},
pages = {65-70},
booktitle = {VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009},
publisher = {IEEE},
isbn = {978-0-7695-3506-7},
}