Efficient Techniques for Directed Test Generation Using Incremental Satisfiability

Prabhat Mishra, Mingsong Chen. Efficient Techniques for Directed Test Generation Using Incremental Satisfiability. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 65-70, IEEE, 2009. [doi]

Abstract

Abstract is missing.