Predicting electromigration mortality under temperature and product lifetime specifications - researchr publication authors

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Vivek Mishra, Sachin S. Sapatnekar. Predicting electromigration mortality under temperature and product lifetime specifications. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016. pages 43, ACM, 2016. [doi]

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