Sumit Mishra, Srinibas Swain, Ved Prakash. Know How Much Sensitive Precision and Recall Validity Measures Are?. In Apostolos Antonacopoulos, Subhasis Chaudhuri, Rama Chellappa, Cheng-Lin Liu 0001, Saumik Bhattacharya, Umapada Pal 0001, editors, Pattern Recognition - 27th International Conference, ICPR 2024, Kolkata, India, December 1-5, 2024, Proceedings, Part II. Volume 15302 of Lecture Notes in Computer Science, pages 335-350, Springer, 2024. [doi]
Abstract is missing.