Amit Mishra, Nidhi Sinha, Satdev, Virendra Singh, Sreejit Chakravarty, Adit D. Singh. Modified Scan Flip-Flop for Low Power Testing. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 367-370, IEEE Computer Society, 2010. [doi]
Abstract is missing.