Naive Bayes Multi-Label Classification Approach for High-Voltage Condition Monitoring

Imene Mitiche, Alan Nesbitt, Philip Boreham, Brian G. Stewart, Gordon Morison. Naive Bayes Multi-Label Classification Approach for High-Voltage Condition Monitoring. In IEEE International Conference on Internet of Things and Intelligence System, IOTAIS 2018, Bali, Indonesia, November 1-3, 2018. pages 162-166, IEEE, 2018. [doi]

Authors

Imene Mitiche

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Alan Nesbitt

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Philip Boreham

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Brian G. Stewart

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Gordon Morison

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