Imene Mitiche, Alan Nesbitt, Philip Boreham, Brian G. Stewart, Gordon Morison. Naive Bayes Multi-Label Classification Approach for High-Voltage Condition Monitoring. In IEEE International Conference on Internet of Things and Intelligence System, IOTAIS 2018, Bali, Indonesia, November 1-3, 2018. pages 162-166, IEEE, 2018. [doi]
Abstract is missing.