Subhasish Mitra. Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 941-946, 2008. [doi]
@inproceedings{Mitra08:1, title = {Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges}, author = {Subhasish Mitra}, year = {2008}, doi = {10.1109/DATE.2008.4484801}, url = {http://dx.doi.org/10.1109/DATE.2008.4484801}, tags = {optimization, reliability}, researchr = {https://researchr.org/publication/Mitra08%3A1}, cites = {0}, citedby = {0}, pages = {941-946}, booktitle = {Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008}, }