Rajrup Mitra, Amrita Das, Jack Heichel, Sattar Dorafshan, Naima Kaabouch. A Comparative Analysis of Two Deep Learning Neural Networks for Defect Detection in Steel Structures Using UAS. In IEEE International Conference on Electro Information Technology, eIT 2023, Romeoville, IL, USA, May 18-20, 2023. pages 430-435, IEEE, 2023. [doi]
Abstract is missing.