Test pattern generation for droop faults

Debasis Mitra, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sandip Kundu, Ashish Nigam, Sandeep K. Dey. Test pattern generation for droop faults. IET Computers & Digital Techniques, 4(4):274-284, 2010. [doi]

Abstract

Abstract is missing.