Joydeep Mitra, Peng Yu, David Zhigang Pan. RADAR: RET-aware detailed routing using fast lithography simulations. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 369-372, ACM, 2005. [doi]
Abstract is missing.