Rikima Mitsuhashi, Takahiro Shinagawa. Exploring Optimal Deep Learning Models for Image-based Malware Variant Classification. In Hong Va Leong, Sahra Sedigh Sarvestani, Yuuichi Teranishi, Alfredo Cuzzocrea, Hiroki Kashiwazaki, Dave Towey, Ji-Jiang Yang, Hossain Shahriar, editors, 46th IEEE Annual Computers, Software, and Applications Conferenc, COMPSAC 2022, Los Alamitos, CA, USA, June 27 - July 1, 2022. pages 779-788, IEEE, 2022. [doi]
@inproceedings{MitsuhashiS22-0,
title = {Exploring Optimal Deep Learning Models for Image-based Malware Variant Classification},
author = {Rikima Mitsuhashi and Takahiro Shinagawa},
year = {2022},
doi = {10.1109/COMPSAC54236.2022.00128},
url = {https://doi.org/10.1109/COMPSAC54236.2022.00128},
researchr = {https://researchr.org/publication/MitsuhashiS22-0},
cites = {0},
citedby = {0},
pages = {779-788},
booktitle = {46th IEEE Annual Computers, Software, and Applications Conferenc, COMPSAC 2022, Los Alamitos, CA, USA, June 27 - July 1, 2022},
editor = {Hong Va Leong and Sahra Sedigh Sarvestani and Yuuichi Teranishi and Alfredo Cuzzocrea and Hiroki Kashiwazaki and Dave Towey and Ji-Jiang Yang and Hossain Shahriar},
publisher = {IEEE},
isbn = {978-1-6654-8810-5},
}