PADLOC: Physically-Aware Defect Localization and Characterization

Soumya Mittal, R. D. (Shawn) Blanton. PADLOC: Physically-Aware Defect Localization and Characterization. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 212-218, IEEE Computer Society, 2017. [doi]

Authors

Soumya Mittal

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R. D. (Shawn) Blanton

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