Rajesh Mittal, Lakshmanan Balasubramanian, Adesh Sontakke, Harikrishna Parthasarathy, Prakash Narayanan, Puneet Sabbarwal, Rubin A. Parekhji. DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-10, IEEE, 2011. [doi]
@inproceedings{MittalBSPNSP11,
title = {DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management},
author = {Rajesh Mittal and Lakshmanan Balasubramanian and Adesh Sontakke and Harikrishna Parthasarathy and Prakash Narayanan and Puneet Sabbarwal and Rubin A. Parekhji},
year = {2011},
doi = {10.1109/TEST.2011.6139128},
url = {http://dx.doi.org/10.1109/TEST.2011.6139128},
researchr = {https://researchr.org/publication/MittalBSPNSP11},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011},
editor = {Bill Eklow and R. D. (Shawn) Blanton},
publisher = {IEEE},
isbn = {978-1-4577-0153-5},
}