Systematic approach for trim test time optimization: Case study on a multi-core RF SOC - researchr publication authors

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Rajesh Mittal, Mudasir Kawoosa, Rubin A. Parekhji. Systematic approach for trim test time optimization: Case study on a multi-core RF SOC. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-9, IEEE, 2014. [doi]

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