Rajesh Mittal, Mudasir Kawoosa, Rubin A. Parekhji. Systematic approach for trim test time optimization: Case study on a multi-core RF SOC. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-9, IEEE, 2014. [doi]
@inproceedings{MittalKP14,
title = {Systematic approach for trim test time optimization: Case study on a multi-core RF SOC},
author = {Rajesh Mittal and Mudasir Kawoosa and Rubin A. Parekhji},
year = {2014},
doi = {10.1109/TEST.2014.7035319},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035319},
researchr = {https://researchr.org/publication/MittalKP14},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}