R. Mittal, Sontakke Sontakke, Rubin A. Parekhji. Test time reduction using parallel RF test techniques. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 40, IEEE Computer Society, 2010. [doi]
@inproceedings{MittalSP10, title = {Test time reduction using parallel RF test techniques}, author = {R. Mittal and Sontakke Sontakke and Rubin A. Parekhji}, year = {2010}, doi = {10.1109/VTS.2010.5469623}, url = {http://dx.doi.org/10.1109/VTS.2010.5469623}, tags = {testing}, researchr = {https://researchr.org/publication/MittalSP10}, cites = {0}, citedby = {0}, pages = {40}, booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA}, publisher = {IEEE Computer Society}, isbn = {978-1-4244-6648-1}, }