Test time reduction using parallel RF test techniques - researchr publication

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R. Mittal, Sontakke Sontakke, Rubin A. Parekhji. Test time reduction using parallel RF test techniques. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 40, IEEE Computer Society, 2010. [doi]

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