Masataka Miyake, Junichi Nakashima, Mitiko Miura-Mattausch. Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions. IEICE Transactions, 95-C(10):1682-1688, 2012. [doi]
@article{MiyakeNM12,
title = {Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions},
author = {Masataka Miyake and Junichi Nakashima and Mitiko Miura-Mattausch},
year = {2012},
url = {http://search.ieice.org/bin/summary.php?id=e95-c_10_1682},
researchr = {https://researchr.org/publication/MiyakeNM12},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {95-C},
number = {10},
pages = {1682-1688},
}