Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions

Masataka Miyake, Junichi Nakashima, Mitiko Miura-Mattausch. Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions. IEICE Transactions, 95-C(10):1682-1688, 2012. [doi]

Abstract

Abstract is missing.