Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara. A Static Method for Analyzing Hotspot Distribution on the LSI. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 73-78, IEEE, 2019. [doi]
@inproceedings{MiyaseKLWK19,
title = {A Static Method for Analyzing Hotspot Distribution on the LSI},
author = {Kohei Miyase and Yudai Kawano and Shyue-Kung Lu and Xiaoqing Wen and Seiji Kajihara},
year = {2019},
doi = {10.1109/ITC-Asia.2019.00026},
url = {https://doi.org/10.1109/ITC-Asia.2019.00026},
researchr = {https://researchr.org/publication/MiyaseKLWK19},
cites = {0},
citedby = {0},
pages = {73-78},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4718-5},
}