Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara. Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. IEICE Transactions, 94-D(6):1216-1226, 2011. [doi]
@article{MiyaseNIHAYFWK11,
title = {Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing},
author = {Kohei Miyase and Kenji Noda and Hideaki Ito and Kazumi Hatayama and Takashi Aikyo and Yuta Yamato and Hiroshi Furukawa and Xiaoqing Wen and Seiji Kajihara},
year = {2011},
url = {http://search.ieice.org/bin/summary.php?id=e94-d_6_1216},
tags = {testing},
researchr = {https://researchr.org/publication/MiyaseNIHAYFWK11},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {94-D},
number = {6},
pages = {1216-1226},
}