Kenji Noda - researchr alias

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Viewing Publication 1 - 13 from 13

2011

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan TestingKohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara. ieicet, 94-D(6):1216-1226, 2011. [doi]

2010

A Study of Capture-Safe Test Generation Flow for At-Speed TestingKohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja. ieicet, 93-A(7):1309-1318, 2010. [doi]

2009

A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environmentKohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara. iccad 2009: 97-104 [doi]

2008

2001

2000

1998

A High-Level Synthesis Method for Weakly Testable Data PathsMichiko Inoue, Takeshi Higashimura, Kenji Noda, Toshimitsu Masuzawa, Hideo Fujiwara. ats 1998: 40-45 [doi]

1997

A 500-MHz 4-Mb CMOS pipeline-burst cache SRAM with point-to-point noise reduction coding I/OKazuyuki Nakamura, Koichi Takeda, Hideo Toyoshima, Kenji Noda, Hiroaki Ohkubo, Tetsuya Uchida, Toshiyuki Shimizu, Toshiro Itani, Ken Tokashiki, Koji Kishimoto. jssc, 32(11):1758-1765, 1997. [doi]

1990

A 55-ns 16-Mb DRAM with built-in self-test function using microprogram ROMToshio Takeshima, Masahide Takada, Hiroki Koike, Hiroshi Watanabe, Shigeru Koshimaru, Kenjiro Mitake, Wataru Kikuchi, Takaho Tanigawa, Tatsunori Murotani, Kenji Noda, Kazuhiro Tasaka, Koji Yamanaka, Kuniaki Koyama. jssc, 25(4):903-911, August 1990. [doi]

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