Nobuyuki Ikezawa - researchr alias

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Viewing Publication 1 - 3 from 3

2002

Effect of mechanical stress induced by etch-stop nitride: impact on deep-submicron transistor performanceShinya Ito, Hiroaki Namba, Tsuyoshi Hirata, Koichi Ando, Shin Koyama, Nobuyuki Ikezawa, Tatsuya Suzuki, Takehiro Saitoh, Tadahiko Horiuchi. mr, 42(2):201-209, 2002. [doi]

2001

An ultrahigh-density high-speed loadless four-transistor SRAM macro with twisted bitline architecture and triple-well shieldKenji Noda, Koichi Takeda 0001, Koujirou Matsui, Shinya Ito, Sadaaki Masuoka, Hideaki Kawamoto, Nobuyuki Ikezawa, Yoshiharu Aimoto, Noritsugu Nakamura, Takahiro Iwasaki, Hideo Toyoshima, Tadahiko Horiuchi. jssc, 36(3):510-515, 2001. [doi]

2000

An ultra-high-density high-speed loadless four-transistor SRAM macro with a dual-layered twisted bit-line and a triple-well shieldKenji Noda, Koujirou Matsui, Shinya Ito, Sadaaki Masuoka, Hiroyuki Kawamoto, Nobuyuki Ikezawa, Koichi Takeda 0001, Yoshiharu Aimoto, Naoto Nakamura, Hideo Toyoshima, Takahiro Iwasaki, Tadahiko Horiuchi. cicc 2000: 283-286 [doi]

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