Kohei Miyase, X. Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara. Transition-Time-Relation based capture-safety checking for at-speed scan test generation. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 895-898, IEEE, 2011. [doi]
@inproceedings{MiyaseWAFYK11,
title = {Transition-Time-Relation based capture-safety checking for at-speed scan test generation},
author = {Kohei Miyase and X. Wen and Masao Aso and Hiroshi Furukawa and Yuta Yamato and Seiji Kajihara},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763300},
researchr = {https://researchr.org/publication/MiyaseWAFYK11},
cites = {0},
citedby = {0},
pages = {895-898},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}