Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor. High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Transactions, 93-D(1):2-9, 2010. [doi]
@article{MiyaseWFYKGWT10,
title = {High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme},
author = {Kohei Miyase and Xiaoqing Wen and Hiroshi Furukawa and Yuta Yamato and Seiji Kajihara and Patrick Girard and Laung-Terng Wang and Mohammad Tehranipoor},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-d_1_2},
tags = {testing},
researchr = {https://researchr.org/publication/MiyaseWFYKGWT10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-D},
number = {1},
pages = {2-9},
}