Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Makoto Takamiya, Takayasu Sakurai. CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring. In International Conference on IC Design and Technology, ICICDT 2019, Suzhou, China, June 17-19, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.