Kfir Mizrachi, Ilan Bloom, Yuval Cassuto. Memory reliability for cells with strong bit-coupling interference. In Proceedings of the International Symposium on Memory Systems, MEMSYS 2017, Alexandria, VA, USA, October 02 - 05, 2017. pages 196-204, ACM, 2017. [doi]
@inproceedings{MizrachiBC17,
title = {Memory reliability for cells with strong bit-coupling interference},
author = {Kfir Mizrachi and Ilan Bloom and Yuval Cassuto},
year = {2017},
doi = {10.1145/3132402.3132413},
url = {http://doi.acm.org/10.1145/3132402.3132413},
researchr = {https://researchr.org/publication/MizrachiBC17},
cites = {0},
citedby = {0},
pages = {196-204},
booktitle = {Proceedings of the International Symposium on Memory Systems, MEMSYS 2017, Alexandria, VA, USA, October 02 - 05, 2017},
publisher = {ACM},
isbn = {978-1-4503-5335-9},
}