Optimal periodic testing policy for circuit with self-testing

Satoshi Mizutani, Toshio Nakagawa, Kodo Ito, Hiroaki Sandoh. Optimal periodic testing policy for circuit with self-testing. Computers & Mathematics with Applications, 51(2):363-370, 2006. [doi]

Authors

Satoshi Mizutani

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Toshio Nakagawa

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Kodo Ito

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Hiroaki Sandoh

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