Satoshi Mizutani, Toshio Nakagawa, Kodo Ito, Hiroaki Sandoh. Optimal periodic testing policy for circuit with self-testing. Computers & Mathematics with Applications, 51(2):363-370, 2006. [doi]
@article{MizutaniNIS06,
title = {Optimal periodic testing policy for circuit with self-testing},
author = {Satoshi Mizutani and Toshio Nakagawa and Kodo Ito and Hiroaki Sandoh},
year = {2006},
doi = {10.1016/j.camwa.2005.11.025},
url = {http://dx.doi.org/10.1016/j.camwa.2005.11.025},
tags = {testing},
researchr = {https://researchr.org/publication/MizutaniNIS06},
cites = {0},
citedby = {0},
journal = {Computers & Mathematics with Applications},
volume = {51},
number = {2},
pages = {363-370},
}