Evaluation of conductive-to-resistive layers interaction in thick-film resistors

K. Mleczko, Z. Zawislak, A. W. Stadler, Andrzej Kolek, Andrzej Dziedzic, J. Cichosz. Evaluation of conductive-to-resistive layers interaction in thick-film resistors. Microelectronics Reliability, 48(6):881-885, 2008. [doi]

Abstract

Abstract is missing.